[linux-l] S.M.A.R.T. Error Log
Norman Steinbach
norm at nsteinbach.de
Mo Nov 26 07:41:22 CET 2012
Hallo @all,
ich habe bei einer PATA-Festplatte, die ich vor ein paar Tagen aus einem
defekten USB-Gehäuse befreit und in ein funktionierendes eingebaut habe,
einmal die smartmontools drüber laufen lassen, und dabei seltsame
Ergebnisse festgestellt, unten die komplette Ausgabe, aber erstmal meine
Fragen dazu:
Die unten gelisteten Fehler (222 bis 226, also nicht die ersten) sehen
seltsam aus, was haben die zu bedeuten? Und: Alle anderen Angaben der
Platte sehen jedoch gut aus, zumindest soweit ich sie interpretieren
kann (aus den Vendor Specific Attributes weiß ich nichts herauszulesen).
Ist die Festplatte nun gesund, oder nicht?
Erklärung: Das kaputte USB-Gehäuse hat sich dadurch bemerkbar gemacht,
dass die Platte sehr lange gebraucht hat, bis sie erkannt wurde, und
beim Lesen größerer Datenmengen (directory-Listings mit vielen
Einträgen, Dateien über ein paar/paarhundert kB) wurde der Spindelmotor
kurz verlangsamt, die Köpfe klackerten und dann hat es eine Zeit lang
gedauert, bis die Daten doch gelesen wurden. Irgend ein Gefühl sagte
mir, dass die Platte jünger ist als das Gehäuse, und eigentlich lt.
Statistik nicht kaputt sein dürfte (auch wenn sie es wohl gewesen wäre,
wenn ich sie länger da drin gelassen hätte).
Kann ich diese Fehler also der kaputten USB-to-IDE-Bridge zuschreiben?
Oder woran könnten die sonst liegen?
Danke & viele Grüße,
Norm at n
Anhang: Augabe von smartctl --a:
> # smartctl --all /dev/sdd
> smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-33-generic] (local build)
> Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
>
> === START OF INFORMATION SECTION ===
> Model Family: Seagate Barracuda 7200.10
> Device Model: ST3500630A
> Serial Number: 9QG7SR1S
> Firmware Version: 3.AAF
> User Capacity: 500.107.862.016 bytes [500 GB]
> Sector Size: 512 bytes logical/physical
> Device is: In smartctl database [for details use: -P show]
> ATA Version is: 7
> ATA Standard is: Exact ATA specification draft version not indicated
> Local Time is: Mon Nov 26 07:27:32 2012 CET
> SMART support is: Available - device has SMART capability.
> SMART support is: Enabled
>
> === START OF READ SMART DATA SECTION ===
> SMART overall-health self-assessment test result: PASSED
> See vendor-specific Attribute list for marginal Attributes.
>
> General SMART Values:
> Offline data collection status: (0x82) Offline data collection activity
> was completed without error.
> Auto Offline Data Collection: Enabled.
> Self-test execution status: ( 0) The previous self-test routine completed
> without error or no self-test has ever
> been run.
> Total time to complete Offline
> data collection: ( 430) seconds.
> Offline data collection
> capabilities: (0x5b) SMART execute Offline immediate.
> Auto Offline data collection on/off support.
> Suspend Offline collection upon new
> command.
> Offline surface scan supported.
> Self-test supported.
> No Conveyance Self-test supported.
> Selective Self-test supported.
> SMART capabilities: (0x0003) Saves SMART data before entering
> power-saving mode.
> Supports SMART auto save timer.
> Error logging capability: (0x01) Error logging supported.
> General Purpose Logging supported.
> Short self-test routine
> recommended polling time: ( 1) minutes.
> Extended self-test routine
> recommended polling time: ( 163) minutes.
>
> SMART Attributes Data Structure revision number: 10
> Vendor Specific SMART Attributes with Thresholds:
> ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
> 1 Raw_Read_Error_Rate 0x000f 108 091 006 Pre-fail Always - 216253834
> 3 Spin_Up_Time 0x0003 097 093 000 Pre-fail Always - 0
> 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 598
> 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
> 7 Seek_Error_Rate 0x000f 082 060 030 Pre-fail Always - 195065151
> 9 Power_On_Hours 0x0032 095 095 000 Old_age Always - 4638
> 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
> 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 593
> 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
> 189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
> 190 Airflow_Temperature_Cel 0x0022 049 045 045 Old_age Always In_the_past 51 (Min/Max 21/52)
> 194 Temperature_Celsius 0x0022 051 055 000 Old_age Always - 51 (0 14 0 0)
> 195 Hardware_ECC_Recovered 0x001a 062 058 000 Old_age Always - 101354973
> 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
> 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
> 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 255
> 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
> 202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
>
> SMART Error Log Version: 1
> ATA Error Count: 226 (device log contains only the most recent five errors)
> CR = Command Register [HEX]
> FR = Features Register [HEX]
> SC = Sector Count Register [HEX]
> SN = Sector Number Register [HEX]
> CL = Cylinder Low Register [HEX]
> CH = Cylinder High Register [HEX]
> DH = Device/Head Register [HEX]
> DC = Device Command Register [HEX]
> ER = Error register [HEX]
> ST = Status register [HEX]
> Powered_Up_Time is measured from power on, and printed as
> DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
> SS=sec, and sss=millisec. It "wraps" after 49.710 days.
>
> Error 226 occurred at disk power-on lifetime: 4613 hours (192 days + 5 hours)
> When the command that caused the error occurred, the device was active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> 25 03 f0 00 9f 55 e0 00 02:42:47.760 READ DMA EXT
> 25 03 10 f0 9e 55 e0 00 02:42:47.759 READ DMA EXT
> 25 03 f0 00 9e 55 e0 00 02:42:47.756 READ DMA EXT
> 25 03 10 f0 9d 55 e0 00 02:42:47.755 READ DMA EXT
> 25 03 f0 00 9d 55 e0 00 02:42:47.752 READ DMA EXT
>
> Error 225 occurred at disk power-on lifetime: 4613 hours (192 days + 5 hours)
> When the command that caused the error occurred, the device was active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> 25 03 f0 00 29 92 e0 00 02:39:33.191 READ DMA EXT
> 25 03 10 f0 28 92 e0 00 02:39:33.188 READ DMA EXT
> 25 03 f0 00 28 92 e0 00 02:39:33.216 READ DMA EXT
> 25 03 10 f0 27 92 e0 00 02:39:33.216 READ DMA EXT
> 25 03 f0 00 27 92 e0 00 02:39:33.212 READ DMA EXT
>
> Error 224 occurred at disk power-on lifetime: 4613 hours (192 days + 5 hours)
> When the command that caused the error occurred, the device was active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> 25 03 f0 00 31 00 e0 00 02:37:07.735 READ DMA EXT
> 25 03 10 f0 30 00 e0 00 02:37:07.735 READ DMA EXT
> 25 03 f0 00 30 00 e0 00 02:37:07.732 READ DMA EXT
> 25 03 10 f0 2f 00 e0 00 02:37:07.731 READ DMA EXT
> 25 03 f0 00 2f 00 e0 00 02:37:07.728 READ DMA EXT
>
> Error 223 occurred at disk power-on lifetime: 4613 hours (192 days + 5 hours)
> When the command that caused the error occurred, the device was active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> 25 03 f0 00 bd 4c e0 00 02:34:08.828 READ DMA EXT
> 25 03 10 f0 bc 4c e0 00 02:34:08.828 READ DMA EXT
> 25 03 f0 00 bc 4c e0 00 02:34:08.824 READ DMA EXT
> 25 03 10 f0 bb 4c e0 00 02:34:08.824 READ DMA EXT
> 25 03 f0 00 bb 4c e0 00 02:34:08.821 READ DMA EXT
>
> Error 222 occurred at disk power-on lifetime: 4613 hours (192 days + 5 hours)
> When the command that caused the error occurred, the device was active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> 25 03 f0 00 9d 44 e0 00 02:29:45.823 READ DMA EXT
> 25 03 10 f0 9c 44 e0 00 02:29:45.820 READ DMA EXT
> 25 03 f0 00 9c 44 e0 00 02:29:45.847 READ DMA EXT
> 25 03 10 f0 9b 44 e0 00 02:29:45.846 READ DMA EXT
> 25 03 f0 00 9b 44 e0 00 02:29:45.843 READ DMA EXT
>
> SMART Self-test log structure revision number 1
> Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
> # 1 Extended offline Completed without error 00% 4638 -
> # 2 Conveyance offline Completed without error 00% 4636 -
> # 3 Extended offline Completed without error 00% 3899 -
>
> SMART Selective self-test log data structure revision number 1
> SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
> 1 0 0 Not_testing
> 2 0 0 Not_testing
> 3 0 0 Not_testing
> 4 0 0 Not_testing
> 5 0 0 Not_testing
> Selective self-test flags (0x0):
> After scanning selected spans, do NOT read-scan remainder of disk.
> If Selective self-test is pending on power-up, resume after 0 minute delay.
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